硅棱镜

ATTENUATED TOTAL REFLECTANCE - SILICON SINGLE CRYSTALS FOR NEUTRON SOURCES Sil’tronix ST aims to manufacture silicon ATR Crystals on demand for different structural investigations: FTIR spectroscopy, ATR spectroscopy, IR spectroscopy, NMR spectroscopy, Raman spectroscopy, x-ray photoelectron spectroscopy, MRI spectroscopy, EPR Spectroscopy, and neutron experiments. We produce our own monocrystalline silicon crystals from raw materials in order to insure the highest quality all along the manufacturing steps. It is also the best way to provide greater flexibility regarding our customer needs. Since 45 years, the company has accumulated experiences on silicon crystallography to provide attenuated total reflectance crystals with the insurance to manufacture the best quality. Single crystal standard dimensions: - 52 x 20 x 2mm 45° ATR Crystal - 80 x 10 x 4mm 45° ATR Crystal