除了粗糙度测量之外,Waveline Map 3D分析软件允许您在工件上捕获特定的配置文件和表面数据。来自Jenoptik的波波测量系统可用于粗糙度或轮廓测量。我们还提供组合这些功能的系统。波波T8000,Surfscan和NanoScan Jenoptik测量系统可以用3D分析软件进行地形扩展。波波地图软件允许您将工件的表面纹理呈现为评估的图形。波波地图直观设计,易于操作。例如,测量数据可以相对于对准,过滤和切除来预先处理。一旦评估步骤改变,就会执行自动重新计算。该系统提供广泛的计量和科学过滤选项。3D分析软件有三个版本提供:基本,专家和保费。 The Expert and Premium versions meet the ISO/TS 25178 standard for 3D parameters. In addition to software, a Y positioning table is also required for topography measurements. This facilitates the necessary workpiece movement. The tables can hold components of up to 30kg in weight, and work with a guide accuracy of approximately 5μm. Benefits • Flexible: Can be used at measuring stations for roughness measurement where necessary • Simple: Intuitive software is easy to use • Fast: Automatic recalculations after changes to evaluation steps • Modular: Three versions that build on each other Applications • Research and development: Tribological studies to optimize surface functions